Data Challenge : Wafers Images Classification

• For Quick readers : the presentation with the method and results is in this file : Data Challenge presentation.pptx

• For Code readers : please find the notebook as Data Challenge - notebook.ipynb

• For Technical readers : you will find the report with the all the needed details as Data_Challenge Report.pdf

Small intro:

The goal of the challenge, sponsored by STMicroelectronics (a global semiconductor company that produces electronic components) in Kaggle, is to build a deep
learning model to classify images of errors in silicon wafers using a database of 8634 microscopic images of wafers.

Results:

• Ranked 3rd in the leaderboard with an accuracy of 98% (private score)
• 69 ms for inference time on GPU